Semiparametric Maximum Likelihood for Nonlinear Regression with Measurement Errors

DOI10.1111/j.0006-341X.2002.00448.xzbMath1210.62044WikidataQ52038361 ScholiaQ52038361MaRDI QIDQ3078971

Daniel W. Schafer, Eun-Young Suh

Publication date: 1 March 2011

Published in: Biometrics (Search for Journal in Brave)

zbMATH Keywords

EM algorithm; errors-in-variables; mixture model; nonparametric maximum likelihood; structural model; vertex direction methods; growth-curve analysis; internal validation; measurement error model regression; von bertalanffy model

Mathematics Subject Classification ID

62G08: Nonparametric regression and quantile regression

62P10: Applications of statistics to biology and medical sciences; meta analysis

62J02: General nonlinear regression

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