Identification of surface impedance of thin dielectric objects from far-field data
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Publication:3081494
DOI10.1088/0266-5611/27/2/025011zbMath1209.35155OpenAlexW2085807907MaRDI QIDQ3081494
Publication date: 8 March 2011
Published in: Inverse Problems (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1088/0266-5611/27/2/025011
Inverse problems for PDEs (35R30) Finite difference methods applied to problems in optics and electromagnetic theory (78M20) Finite difference methods for boundary value problems involving PDEs (65N06) Inverse problems (including inverse scattering) in optics and electromagnetic theory (78A46)
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Application of the linear sampling method to identify cracks with impedance boundary conditions ⋮ The factorization method for the inverse scattering problem from thin dielectric objects ⋮ A modified transmission eigenvalue problem for scattering by a partially coated crack
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