Automatic parametric fault detection in complex analog systems based on a method of minimum node selection
DOI10.1515/AMCS-2016-0045zbMATH Open1347.93130OpenAlexW2525899694MaRDI QIDQ328909FDOQ328909
Jacek Wojciechowski, Adrian Bilski
Publication date: 21 October 2016
Published in: International Journal of Applied Mathematics and Computer Science (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1515/amcs-2016-0045
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Cites Work
- Support-vector networks
- A unified decomposition approach for fault location in large analog circuits
- An algorithm for multiple fault diagnosis in analogue circuits
- Fault diagnosis for linear systems via multifrequency measurements
- An Introduction to Tabu Search
- A method for fault diagnosis in linear electronic circuits
- A new diagnosis approach for handling tolerance in analog and mixed-signal circuits by using fuzzy math
- Title not available (Why is that?)
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