Entanglement across extended random defects in the XX spin chain

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Abstract: We study the half-chain entanglement entropy in the ground state of the spin-1/2 XX chain across an extended random defect, where the strength of disorder decays with the distance from the interface algebraically as Deltalsiml−kappa. In the whole regime kappage0, the average entanglement entropy is found to increase logarithmically with the system size L as SLsimeqfraccmeff(kappa)6lnL+const, where the effective central charge cmeff(kappa) depends on kappa. In the regime kappa<1/2, where the extended defect is a relevant perturbation, the strong-disorder renormalization group method gives cmeff(kappa)=(1−2kappa)ln2, while, in the regime kappage1/2, where the extended defect is irrelevant in the bulk, numerical results indicate a non-zero effective central charge, which increases with kappa. The variation of cmeff(kappa) is thus found to be non-monotonic and discontinuous at kappa=1/2.












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