Influence of the analysis window on the metrological performance of the grid method

DOI10.1007/S10851-016-0650-ZzbMATH Open1386.94015OpenAlexW2329160607MaRDI QIDQ333624FDOQ333624

Authors: Frédéric Sur, Michel Grédiac 

Publication date: 31 October 2016

Published in: Journal of Mathematical Imaging and Vision (Search for Journal in Brave)

Full work available at URL: https://hal.inria.fr/hal-01298523/file/sur16influence.pdf

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zbMATH Keywords

derivative of a random processdisplacement and strain mapsgrid methodimage-based contactless measurementspatially correlated noiseWigner-ville transformwindowed Fourier analysis

Mathematics Subject Classification ID

Factor analysis and principal components; correspondence analysis (62H25) Image processing (compression, reconstruction, etc.) in information and communication theory (94A08)

Cites Work

• Title not available (Why is that?)
• On biases in displacement estimation for image registration, with a focus on photomechanics
• Towards deconvolution to enhance the grid method for in-plane strain measurement
• Basics of metrology and introduction to techniques
• Grid method, moiré and deflectometry
• Separability, positivity, and minimum uncertainty in time–frequency energy distributions

Cited In (3)

• Measuring forces in a 2D multi-contact system using the virtual fields method: principle, simulations and experimental application to a three-particle system
• Towards deconvolution to enhance the grid method for in-plane strain measurement
• Grid method, moiré and deflectometry

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