Influence of the analysis window on the metrological performance of the grid method
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Cites work
- scientific article; zbMATH DE number 1465030 (Why is no real title available?)
- Basics of metrology and introduction to techniques
- Grid method, moiré and deflectometry
- On biases in displacement estimation for image registration, with a focus on photomechanics
- Separability, positivity, and minimum uncertainty in time–frequency energy distributions
- Towards deconvolution to enhance the grid method for in-plane strain measurement
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