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Moment estimators of defect pattern frequencies, allowing for inspection error

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Publication:3347161
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DOI10.1080/03610928408828750zbMATH Open0553.62094OpenAlexW2133173128MaRDI QIDQ3347161FDOQ3347161


Authors: Samuel Kotz, Norman Johnson Edit this on Wikidata


Publication date: 1984

Published in: Communications in Statistics: Theory and Methods (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/03610928408828750





zbMATH Keywords

inspection errorsexplicit formulasunbiased estimatorssampling inspectionmoment estimators of defect pattern frequencies


Mathematics Subject Classification ID

Applications of statistics in engineering and industry; control charts (62P30)


Cites Work

  • Some distributions arising from faulty inspection with multitype defectives, and an application to grading


Cited In (2)

  • Improved moment-estimation formulas using more than three subjective fractiles
  • Liquid crystal display surface uniformity defect inspection using analysis of variance and exponentially weighted moving average techniques





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