A new class of estimators for the reduced second moment measure of point processes
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Publication:3359615
DOI10.1093/BIOMET/78.2.281zbMATH Open0733.62089OpenAlexW1969642721MaRDI QIDQ3359615FDOQ3359615
Authors: Michael L. Stein
Publication date: 1991
Published in: Biometrika (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1093/biomet/78.2.281
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simulation studyPoisson processreduced second moment measurecluster processesunbiasedness propertiesedge-corrected estimatorsisotropic edge correctionstationary isotropic point process
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- Kaplan-Meier estimators of distance distributions for spatial point processes
- Asymptotically optimal estimation for the reduced second moment measure of point processes
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