Sensitivity of resonance frequency in the detection of thin layer using nano-slit structures

DOI10.1093/IMAMAT/HXAA041zbMATH Open1476.74085arXiv2005.03762OpenAlexW3098162554MaRDI QIDQ3382887FDOQ3382887

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Publication date: 22 September 2021

Published in: IMA Journal of Applied Mathematics (Search for Journal in Brave)

Abstract: We derive the formulas for the resonance frequencies and their sensitivity when the nano-slit structures are used in the detection of thin layers. For a thin layer with a thickness of $H$ deposited over the nanostructure, we show quantitatively that for both single and periodic slit structures with slit aperture size $delta$, the sensitivity of resonance frequency reduces as $H$ increases. Specifically, the sensitivity is of order $O(delta/H)$ if $H>delta$ and of order $O(1+lnH/delta)$ otherwise. The evanescent wave modes are present along the interface between the thin dielectric film and ambient medium above. From the mathematical derivations, it is observed that the sensitivity of the resonance frequency highly depends on the effect of evanescent wave modes on the tiny slit apertures.

Full work available at URL: https://arxiv.org/abs/2005.03762

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zbMATH Keywords

asymptotic expansionsensitivity analysisnano-sensingthin film structure

Mathematics Subject Classification ID

Wave scattering in solid mechanics (74J20) Inverse problems for waves in solid mechanics (74J25) Micromechanics of solids (74M25) Junctions (74K30)

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