An integrated quality, maintenance and production model based on the delayed monitoring under the ARMA control chart
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Publication:3389672
Cites work
- A Statistical Control Chart for Stationary Process Data
- A generalized economic model for joint determination of production run, inspection schedule and control chart design
- An Integrated Cost Model for the Joint Optimization of Process Control and Maintenance
- An adaptive variable-parameters scheme for the simultaneous monitoring of the mean and variability of an autocorrelated multivariate normal process
- An integrated model for economic design of chi-square control chart and maintenance planning
- An integrated quality and maintenance model for two-unit series systems
- Economic and economic-statistical design of a chi-square chart for CBM
- Economic and economic-statistical design of a multivariate Bayesian control chart for condition-based maintenance
- Economic design of integrated model of control chart and maintenance management
- Effect of maintenance on the economic design of \(\overline x\)-control chart
- Integrated production and quality model under various preventive maintenance policies
- Integrating on-line process control and imperfect corrective maintenance: an economical design
- Joint optimisation of double warning T2-Hotelling chart and maintenance policy with multiple assignable causes
- Joint optimization of \(\overline{X}\) control chart and preventive maintenance policies: a discrete-time Markov chain approach
Cited in
(5)- Bivariate copula-based CUSUM charts for monitoring conditional nonlinear processes with first-order autocorrelation
- Simultaneous optimization of inventory, maintenance, and quality for production systems subject to multiple mean and variance shifts
- Integration of inventory control, maintenance policy, and quality control for selling products under warranty
- Robust design of ARMA and ACC charts for imperfect and autocorrelated processes under uncertainty
- Robust optimization of an imperfect process when the mean and variance are jointly monitored under dependent multiple assignable causes
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