Reliability of Complex Devices in Random Environments
From MaRDI portal
Publication:3415833
DOI10.1017/S0269964800000322zbMath1133.90321MaRDI QIDQ3415833
Süleyman Özekici, Erhan Çinlar
Publication date: 19 January 2007
Published in: Probability in the Engineering and Informational Sciences (Search for Journal in Brave)
90B25: Reliability, availability, maintenance, inspection in operations research
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Cites Work
- A concept of positive dependence for exchangeable random variables
- Optimal replacement for systems governed by Markov additive shock processes
- Nonstationary shock models
- Note on the behavior of thermorheologically simple materials in random temperature fields
- Shock models and wear processes
- Shock models with underlying birth process
- Optimal replacement with semi-Markov shock models