An Improvement Over the Information Lower Bound in Binomial Group Testing

DOI10.1017/S0269964800000863MaRDI QIDQ3415894zbMATH OpenOpenAlexFDO

Authors Yi-Ching Yao

Publication date 19 January 2007

Published in Probability in the Engineering and Informational Sciences (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1017/s0269964800000863

Mathematics Subject Classification ID

Testing in survival analysis and censored data (62N03) Applications of statistics in engineering and industry; control charts (62P30)

Recommendations

• An efficient algorithm for combinatorial group testing
• A Fundamental Monotonicity in Group Testing
• Optimal Binomial Group Testing with a Test History
• Generalized Binary Binomial Group Testing
• Optimal Two-Stage Algorithms for Group Testing Problems

Cites work

• The cutoff point for group testing

Cited in

(2)

• A Monotonicity Result for Inspecting Independent Items
• Optimal Binomial Group Testing with a Test History

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