The α-reliable mean-excess regret model for stochastic facility location modeling
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Publication:3423286
DOI10.1002/NAV.20180zbMATH Open1106.90050OpenAlexW2076373516MaRDI QIDQ3423286FDOQ3423286
Authors: Gang Chen, Mark S. Daskin, Stanislav P. Uryasev, Zuo-Jun (Max) Shen
Publication date: 20 February 2007
Published in: Naval Research Logistics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1002/nav.20180
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Cites Work
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- Pre-positioning planning for emergency response with service quality constraints
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- Multi-echelon supply chain design considering unreliable facilities with facility hardening possibility
- Effective location models for sorting recyclables in public management
- A stochastic programming approach for shelter location and evacuation planning
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