The α-reliable mean-excess regret model for stochastic facility location modeling

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Publication:3423286

DOI10.1002/NAV.20180zbMATH Open1106.90050OpenAlexW2076373516MaRDI QIDQ3423286FDOQ3423286


Authors: Gang Chen, Mark S. Daskin, Stanislav P. Uryasev, Zuo-Jun (Max) Shen Edit this on Wikidata


Publication date: 20 February 2007

Published in: Naval Research Logistics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1002/nav.20180




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