Two-phased meta-heuristic methods for the post-mapping yield control problem
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Publication:3430254
DOI10.1080/00207540600619726zbMath1114.90440MaRDI QIDQ3430254
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Publication date: 21 March 2007
Published in: International Journal of Production Research (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/00207540600619726
linear programming; simulated annealing; genetic algorithm; color filter (CF); liquid crystal display (LCD); post mapping; thin film transistor (TFT)
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