Bayesian Analysis of Competing Risks with Partially Masked Cause of Failure

DOI10.1111/1467-9876.00390zbMath1111.62326OpenAlexW1978778777MaRDI QIDQ3435741

Mousumi Banerjee, Ananda Sen, Sanjib Basu

Publication date: 7 May 2007

Published in: Journal of the Royal Statistical Society Series C: Applied Statistics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1111/1467-9876.00390

Mathematics Subject Classification ID

Bayesian inference (62F15) Reliability and life testing (62N05)

Related Items (16)

A consistent NPMLE of the joint distribution function with competing risks data under the dependent masking and right-censoring model ⋮ Analysis of masked competing risks data with cause and time dependent masking mechanism ⋮ Robust estimation with variational Bayes in presence of competing risks ⋮ Multiple imputation of masked competing risks data using machine learning algorithms ⋮ The random partition masking model for interval-censored and masked competing risks data ⋮ Robust Bayesian estimation of cumulative incidence function for competing risk data with missing causes ⋮ An alternative competing risk model to the Weibull distribution for modelling aging in lifetime data analysis ⋮ A note on a transformation under censoring with application to partial least squares regression ⋮ Consistency of the Generalized MLE with Interval-Censored and Masked Competing Risks Data ⋮ Nonparametric Bayesian Analysis of Competing Risks Problem with Masked Data ⋮ The competing risks Cox model with auxiliary case covariates under weaker missing-at-random cause of failure ⋮ Bayesian accelerated life testing under competing log-location-scale family of causes of failure ⋮ Identifiability of masking probabilities in competing risks models with emphasis on Weibull models ⋮ Inference About the Masking Probabilities in the Competing Risks Model ⋮ Maximum likelihood analysis of masked series system lifetime data ⋮ Bayesian Analysis of Masked Series System Lifetime Data

Uses Software

• SPLIDA

Cites Work

• Estimating system and component reliabilities under partial information on cause of failure
• Bayesian analysis for masked system failure data using non-identical Weibull models
• Bayesian analysis of incomplete time and cause of failure data
• Monitoring Processes with Data Censored Owing to Competing Risks by Using Exponentially Weighted Moving Average Control Charts
• Exact maximum likelihood estimation using masked system data
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