Regression analysis of mixed recurrent-event and panel-count data with additive rate models
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Publication:3465725
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Cites work
- A nonparametric test for the equality of counting processes with panel count data
- A semiparametric additive rates model for recurrent event data
- A semiparametric pseudolikelihood estimation method for panel count data
- Analysis of Longitudinal Data in the Presence of Informative Observational Times and a Dependent Terminal Event, with Application to Medical Cost Data
- Analysis of recurrent events with non-negligible event duration, with application to assessing hospital utilization
- Estimation of Reliability in Field-Performance Studies
- Inferences for a semiparametric model with panel data
- Joint Modeling and Analysis of Longitudinal Data with Informative Observation Times
- New multi-sample nonparametric tests for panel count data
- Nonparametric inference based on panel count data
- Regression Parameter Estimation from Panel Counts
- Semiparametric analysis of the additive risk model
- Semiparametric Regression for the Mean and Rate Functions of Recurrent Events
- Some Simple Robust Methods for the Analysis of Recurrent Events
- Statistical analysis of panel count data
- The statistical analysis of recurrent events.
- Two likelihood-based semiparametric estimation methods for panel count data with covariates
Cited in
(9)- Statistical analysis of clustered mixed recurrent-event data with application to a cancer survivor study
- Clustered Mixed Nonhomogeneous Poisson Process Spline Models for the Analysis of Recurrent Event Panel Data
- A nonparametric time-varying coefficient model for panel count data
- Regression analysis of general mixed recurrent event data
- Additive and multiplicative models with mixed recurrent events and panel data
- Regression analysis of clustered panel count data with additive mean models
- Regression analysis of mixed panel count data with informative indicator processes
- Semiparametric regression analysis of mixed recurrent event and panel count data with multiple causes of failure
- Analysis of repeated events and panel count data
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