Optimal testing-policies for intermittent faults
DOI10.1109/24.46484zbMATH Open0703.90035OpenAlexW2103617187WikidataQ56966590 ScholiaQ56966590MaRDI QIDQ3483056FDOQ3483056
Authors: Toshio Nakagawa, Kazumi Yasui
Publication date: 1989
Published in: IEEE Transactions on Reliability (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1109/24.46484
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- A simple fault-diagnosis system with periodic testing
- Simultaneous demonstration tests involving sparse failures
- Optimal testing policy for a computer system with fault margin
- Optimal periodic testing policy for circuit with self-testing
- Title not available (Why is that?)
- A random maintenance scheduling model to reduce fault diagnosis time
- Development of a multiple intermittent fault testing strategy
- Optimal test Interval for a Monotone Safety System
- Minimax fault testing strategies
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