A new paradigm for rule-based scheduling in the wafer probe centre
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Publication:3518508
DOI10.1080/00207540601137199zbMath1140.90396OpenAlexW2103934020MaRDI QIDQ3518508
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Publication date: 8 August 2008
Published in: International Journal of Production Research (Search for Journal in Brave)
Full work available at URL: http://ntur.lib.ntu.edu.tw//handle/246246/141155
Related Items (3)
Using a family of critical ratio-based approaches to minimize the number of tardy jobs in the job shop with sequence dependent setup times ⋮ A new dispatching rule based genetic algorithm for the multi-objective job shop problem ⋮ Rule-based scheduling in wafer fabrication with due date-based objectives
Cites Work
- An interactive scheduler for a wafer probe centre in semiconductor manufacturing
- Scheduling of wafer test processes in semiconductor manufacturing
- The wafer probing scheduling problem (WPSP)
- Selection of dispatching rules on multiple dispatching decision points in real-time scheduling of a semiconductor wafer fabrication system
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