Diagonal Circuit Identity Testing and Lower Bounds
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Publication:3521908
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Cited in
(28)- A case of depth-3 identity testing, sparse factorization and duality
- Blackbox identity testing for sum of special ROABPs and its border class
- Univariate ideal membership parameterized by rank, degree, and number of generators
- Improved hitting set for orbit of ROABPs
- A note on parameterized polynomial identity testing using hitting set generators
- Linear projections of the Vandermonde polynomial
- On the limits of depth reduction at depth 3 over small finite fields
- Arithmetic circuits: a chasm at depth 3
- Geometric complexity theory. V: Efficient algorithms for Noether normalization
- Recent results on polynomial identity testing
- Read-once polynomial identity testing
- Towards blackbox identity testing of log-variate circuits
- scientific article; zbMATH DE number 7471587 (Why is no real title available?)
- On the Symmetries of and Equivalence Test for Design Polynomials.
- scientific article; zbMATH DE number 7561742 (Why is no real title available?)
- Hitting-Sets for ROABP and Sum of Set-Multilinear Circuits
- Deterministic identity testing of depth-4 multilinear circuits with bounded top fan-in
- Improved Explicit Hitting-Sets for ROABPs
- Schur polynomials do not have small formulas if the determinant does not
- Cyclotomic identity testing and applications
- Geometric complexity theory for product-plus-power
- Fixed-parameter debordering of Waring rank
- Derandomizing multivariate polynomial factoring for low degree factors
- Hitting sets for orbits of circuit classes and polynomial families
- Explicit commutative ROABPs from partial derivatives
- Derandomization and absolute reconstruction for sums of powers of linear forms
- Fast exact algorithms using Hadamard product of polynomials
- Deterministic polynomial identity tests for multilinear bounded-read formulae
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