Feature selection by higher criticism thresholding achieves the optimal phase diagram

From MaRDI portal
Publication:3559955

DOI10.1098/RSTA.2009.0129zbMATH Open1185.62113arXiv0812.2263OpenAlexW3100205528WikidataQ51787285 ScholiaQ51787285MaRDI QIDQ3559955FDOQ3559955


Authors: David Donoho, Jiashun Jin Edit this on Wikidata


Publication date: 8 May 2010

Published in: Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences (Search for Journal in Brave)

Abstract: We consider two-class linear classification in a high-dimensional, low-sample size setting. Only a small fraction of the features are useful, the useful features are unknown to us, and each useful feature contributes weakly to the classification decision -- this setting was called the rare/weak model (RW Model). We select features by thresholding feature z-scores. The threshold is set by {it higher criticism} (HC). Let peei denote the P-value associated to the i-th z-score and pee(i) denote the i-th order statistic of the collection of P-values. The HC threshold (HCT) is the order statistic of the z-score corresponding to index i maximizing (i/npee(i))/sqrtpee(i)(1pee(i)). The ideal threshold optimizes the classification error. In cite{PNAS} we showed that HCT was numerically close to the ideal threshold. We formalize an asymptotic framework for studying the RW model, considering a sequence of problems with increasingly many features and relatively fewer observations. We show that along this sequence, the limiting performance of ideal HCT is essentially just as good as the limiting performance of ideal thresholding. Our results describe two-dimensional {it phase space}, a two-dimensional diagram with coordinates quantifying "rare" and "weak" in the RW model. Phase space can be partitioned into two regions -- one where ideal threshold classification is successful, and one where the features are so weak and so rare that it must fail. Surprisingly, the regions where ideal HCT succeeds and fails make the exact same partition of the phase diagram. Other threshold methods, such as FDR threshold selection, are successful in a substantially smaller region of the phase space than either HCT or Ideal thresholding.


Full work available at URL: https://arxiv.org/abs/0812.2263




Recommendations




Cites Work


Cited In (28)





This page was built for publication: Feature selection by higher criticism thresholding achieves the optimal phase diagram

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q3559955)