Combined Scheduling Criteria Approach for Semiconductor Wafer Fabrication System Based on Fuzzy Cognitive Maps

DOI10.1007/978-3-642-03664-4_141zbMath1189.90061OpenAlexW28219292MaRDI QIDQ3563324

Feng Liang

Publication date: 31 May 2010

Published in: Advances in Soft Computing (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/978-3-642-03664-4_141

zbMATH Keywords

fuzzy cognitive mapsemiconductor wafer fabrication systemcombined scheduling criteria

Mathematics Subject Classification ID

Management decision making, including multiple objectives (90B50) Deterministic scheduling theory in operations research (90B35)

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