Universal Test Sets for Reversible Circuits

DOI10.1007/978-3-642-14031-0_38zbMath1286.94120OpenAlexW1489666730MaRDI QIDQ3578335

Shota Fukuyama, Satoshi Tayu, Shuichi Ueno

Publication date: 20 July 2010

Published in: Lecture Notes in Computer Science (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/978-3-642-14031-0_38

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

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