Universal Test Sets for Reversible Circuits
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Publication:3578335
DOI10.1007/978-3-642-14031-0_38zbMath1286.94120OpenAlexW1489666730MaRDI QIDQ3578335
Shota Fukuyama, Satoshi Tayu, Shuichi Ueno
Publication date: 20 July 2010
Published in: Lecture Notes in Computer Science (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1007/978-3-642-14031-0_38
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