Publication:3610846

zbMath1174.82346MaRDI QIDQ3610846

Chuanjun Chen, Yi-Rang Yuan

Publication date: 6 March 2009

zbMATH Keywords

finite volume methods; error estimate; method of characteristics; semiconductor

Mathematics Subject Classification ID

65N30: Finite element, Rayleigh-Ritz and Galerkin methods for boundary value problems involving PDEs

82D37: Statistical mechanics of semiconductors

65M60: Finite element, Rayleigh-Ritz and Galerkin methods for initial value and initial-boundary value problems involving PDEs