Scalable Optimal Test Patterns for Crosstalk-induced Faults on Deep Submicron Global Interconnects

DOI10.1142/9789812832245_0006zbMath1156.94439OpenAlexW2328911594MaRDI QIDQ3614597

Yeow Meng Chee, Charles J. Colbourn

Publication date: 9 March 2009

Published in: Coding and Cryptology (Search for Journal in Brave)

Full work available at URL: https://semanticscholar.org/paper/8dff876cdf78165ff5b54ae076df354e6d759132

zbMATH Keywords

built-in self-testfault modeltest patternscrosstalk faultsDSM interconnects

Mathematics Subject Classification ID

Analytic circuit theory (94C05)

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