Testing randomness for cryptographic applications
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Publication:3616652
zbMATH Open1156.94353MaRDI QIDQ3616652FDOQ3616652
Authors: Mituaki Huzii, Yuichi Takeda, Norio Watanabe, Toshinari Kamakura, Takakazu Sugiyama 
Publication date: 26 March 2009
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- On Independence and Sensitivity of Statistical Randomness Tests
- Walsh-Hadamard randomness test and new methods of test results integration
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