scientific article; zbMATH DE number 3814762
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Publication:3662436
zbMATH Open0515.62030MaRDI QIDQ3662436FDOQ3662436
Publication date: 1983
Title of this publication is not available (Why is that?)
epsilon contaminationcontaminated exponential familyoptimal IC* statisticrobust asymptotic testing modelspecial capacitiestotal neighbourhoods
Asymptotic properties of parametric tests (62F05) Robustness and adaptive procedures (parametric inference) (62F35)
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