A Semi-Parametric Approach to Testing for Reliability Growth, with Application to Software Systems
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Publication:3725403
DOI10.1109/TR.1986.4335439zbMATH Open0594.62109WikidataQ120821853 ScholiaQ120821853MaRDI QIDQ3725403FDOQ3725403
Authors: Ron S. Kenett, Moshe Pollak 
Publication date: 1986
Published in: IEEE Transactions on Reliability (Search for Journal in Brave)
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