Rectifying Inspection for Defects

DOI10.1109/TR.1986.4335454zbMATH Open0603.90061MaRDI QIDQ3740539FDOQ3740539

W. C. Guenther

Publication date: 1986

Published in: IEEE Transactions on Reliability (Search for Journal in Brave)

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zbMATH Keywords

average outgoing quality limitgamma prioraverage cost per lotBayes sampling plansrectifying inspection plans

Mathematics Subject Classification ID

Reliability and life testing (62N05) Applications of statistics in engineering and industry; control charts (62P30) Reliability, availability, maintenance, inspection in operations research (90B25)

Cited In (2)

• Optimum rectifying inspection plans
• Sequential Defect Removal Sampling

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