A test of the exponential MTBF and comparison of power functions of the random censoring case
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Publication:3777282
DOI10.1109/24.3725zbMATH Open0637.62094OpenAlexW2059416952MaRDI QIDQ3777282FDOQ3777282
Authors: Jee Soo Kim
Publication date: 1988
Published in: IEEE Transactions on Reliability (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1109/24.3725
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