A Simple Procedure for Computing Performance Characteristics of Truncated Sequential Tests with Exponential Lifetimes

DOI10.2307/1268520zbMATH Open0421.62076OpenAlexW4232184858MaRDI QIDQ3854504FDOQ3854504

Authors: Peichuen Kao, Edward P. C. Kao, Jack M. Mogg 

Publication date: 1979

Full work available at URL: https://doi.org/10.2307/1268520

zbMATH Keywords

operating characteristicsexponential lifetimestruncated sequential testsaverage termination times

Mathematics Subject Classification ID

Reliability and life testing (62N05) Sequential statistical analysis (62L10)

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