A Simple Procedure for Computing Performance Characteristics of Truncated Sequential Tests with Exponential Lifetimes

DOI10.2307/1268520MaRDI QIDQ3854504zbMATH OpenOpenAlexFDO

Authors Peichuen Kao, Edward P. C. Kao, Jack M. Mogg

Publication date 1979

Full work available at URL https://doi.org/10.2307/1268520

zbMATH Keywords

operating characteristicsexponential lifetimestruncated sequential testsaverage termination times

Mathematics Subject Classification ID

Reliability and life testing (62N05) Sequential statistical analysis (62L10)

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