Testing for Single Intermittent Failures in Combinational Circuits by Maximizing the Probability of Fault Detection

DOI10.1109/TC.1980.1675595MaRDI QIDQ3870830zbMATH OpenOpenAlexFDO

Authors Jacob Savir

Publication date 1980

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tc.1980.1675595

zbMATH Keywords

combinational circuitsintermittent fault detectionirredundant circuitmaximum likelihood estimatorrandom testing

Mathematics Subject Classification ID

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