Corrected confidence intervals based on the signed root transformation for multi-parameter sequentially designed experiments
From MaRDI portal
Publication:389310
DOI10.1016/j.jspi.2013.10.002zbMath1279.62164OpenAlexW2014090746MaRDI QIDQ389310
Publication date: 20 January 2014
Published in: Journal of Statistical Planning and Inference (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.jspi.2013.10.002
nuisance parameterLaplace approximationapproximately pivotal quantitymarginal posterior distributionStein's identityvery weak expansion
Parametric tolerance and confidence regions (62F25) General nonlinear regression (62J02) Sequential statistical design (62L05)
Cites Work
- Unnamed Item
- Unnamed Item
- Unnamed Item
- Unnamed Item
- Unnamed Item
- Unnamed Item
- Unnamed Item
- Unnamed Item
- Unnamed Item
- Unnamed Item
- Unnamed Item
- Unnamed Item
- Unnamed Item
- A decomposition for the likelihood ratio statistic and the Bartlett correction - a Bayesian argument
- Asymptotic posterior normality for multiparameter problems
- Very weak expansions for sequential confidence levels
- Approximate confidence intervals after a sequential clinical trial comparing two exponential survival curves with censoring
- Corrected confidence intervals following a sequential adaptive clinical trial with binary responses
- Corrected confidence intervals for adaptive nonlinear regression models
- Very weak expansions for sequentially designed experiments: Linear models
- DESIGN OF EXPERIMENTS IN NON-LINEAR SITUATIONS
- Recent Advances in Nonlinear Experimental Design
- Experimental Design for Binary Data
- Corrected Confidence Levels for Adaptive Nonlinear Regression
- Sequential Tests Involving Two Populations
- Compound D- and D s -Optimum Designs for Determining the Order of a Chemical Reaction
- Nonlinear Experiments: Optimal Design and Inference Based on Likelihood