Log-Rank vs X Test for Exponentiality

DOI10.1109/TR.1980.5220707zbMATH Open0453.62085OpenAlexW2074610837MaRDI QIDQ3900879FDOQ3900879

Authors: Dennis W. McLeavey, Warren F. Rogers, Crayton C. Walker 

Publication date: 1980

Published in: IEEE Transactions on Reliability (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/tr.1980.5220707

zbMATH Keywords

powerlinear regressionreliabilityexponential distributiongoodness of fitslope of regression line

Mathematics Subject Classification ID

Parametric hypothesis testing (62F03) Reliability and life testing (62N05)

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