Expected value analysis of combinational logic networks

DOI10.1109/TCS.1981.1084999zbMATH Open0458.94067MaRDI QIDQ3908960FDOQ3908960

Authors: Steven C. Bass, John W. Grundmann 

Publication date: 1981

Published in: IEEE Transactions on Circuits and Systems (Search for Journal in Brave)

zbMATH Keywords

probabilistic analysis

Mathematics Subject Classification ID

Reliability and life testing (62N05)

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