Expected value analysis of combinational logic networks

DOI10.1109/TCS.1981.1084999MaRDI QIDQ3908960zbMATH OpenFDO

Authors Steven C. Bass, John W. Grundmann

Publication date 1981

Published in IEEE Transactions on Circuits and Systems (Search for Journal in Brave)

zbMATH Keywords

probabilistic analysis

Mathematics Subject Classification ID

Reliability and life testing (62N05)

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