A Design of Programmable Logic Arrays with Universal Tests

DOI10.1109/TC.1981.1675712zbMATH Open0467.94027OpenAlexW2029173745MaRDI QIDQ3921158FDOQ3921158

Authors: Hideo Fujiwara, K. Kinoshita 

Publication date: 1981

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/tc.1981.1675712

zbMATH Keywords

fault detectionfault locationlogic circuitseasily testable design

Mathematics Subject Classification ID

Cited In (1)

• Some remarks on the test complexity of iterative logic arrays (extended abstract)

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