The Reliability of Memory with Single-Error Correction
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Publication:3946093
DOI10.1109/TC.1982.1676042zbMath0485.94031OpenAlexW1905262094MaRDI QIDQ3946093
W. F. Mikhail, R. W. Bartoldus, Robert A. Rutledge
Publication date: 1982
Published in: IEEE Transactions on Computers (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1109/tc.1982.1676042
fault-tolerant systemssemiconductor memoryhigher level failure modesmemory chip failuresmemory organizations
Fault detection; testing in circuits and networks (94C12) Reliability, testing and fault tolerance of networks and computer systems (68M15) Reliability and life testing (62N05)