Accelerated life tests under competing weibull causes of failure
From MaRDI portal
Publication:3963912
DOI10.1080/03610928208828388zbMath0498.62083MaRDI QIDQ3963912
Publication date: 1982
Published in: Communications in Statistics - Theory and Methods (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/03610928208828388
Weibull distribution; maximum likelihood estimators; competing risks; dependent risks; accelerated life tests; censored sampling; independent risks
62N05: Reliability and life testing
Related Items
BayesianD-optimal Accelerated Life Test plans for series systems with competing exponential causes of failure, Analysis of simple step-stress model in presence of competing risks, Objective Bayesian analysis of accelerated competing failure models under type-I censoring, On a bivariate accelerated life test, Bayesian accelerated life testing under competing log-location-scale family of causes of failure, Optimality and bias of some interpolation and extrapolation designs, Exact inference for a simple step-stress model with competing risks for failure from exponential distribution under type-II censoring, Estimation in step-stress life tests with complementary risks from the exponentiated exponential distribution under time constraint and its applications to UAV data, Inference for a simple step-stress model with competing risks for failure from the exponential distribution under time constraint, Competing failure modes in accelerated life testing, Bayesian Accelerated Life Testing under Competing Weibull Causes of Failure, Analysis of Bivariate Accelerated Life Test Data for the Bivariate Exponential Distribution, Statistical analysis of a two-unit dependent repairable system, Weibull accelerated life tests when there are competing causes of failure, Least Squares estimation for the multivariate weibull model of bougaard based on accelerated life test of system and component
Cites Work