Probabilistic tolerance design for a subsystem under burr distribution using taguchi's loss functions
DOI10.1080/03610929008830467zbMATH Open0744.62138OpenAlexW1984820781MaRDI QIDQ3978043FDOQ3978043
Authors: Hsien-Tang Tsai 
Publication date: 25 June 1992
Published in: Communications in Statistics: Theory and Methods (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/03610929008830467
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Cites Work
- A table of normal integrals
- Cumulative Frequency Functions
- Title not available (Why is that?)
- The Burr Distribution as a Failure Model from a Bayesian Approach
- Two-Sided Screening Procedures in the Bivariate Case
- Title not available (Why is that?)
- Economic Design of a One-Sided Screening Procedure Using a Correlated Variable
- A One-Sided Double Screening Procedure Using Individual Unit Misclassification Error
- Title not available (Why is that?)
- A Selection Procedure Using a Screening Variate
- A Screening Method for Increasing Acceptable Product with Some Parameters Unknown
- Screening Based on Normal Variables
- Screening on Correlated Variables: A Bayesian Approach
Cited In (5)
- Title not available (Why is that?)
- Economic design of VSIX̄control chart with correlated non-normal data under multiple assignable causes
- A sensitivity study on the bootstrap confidence interval of the capability index \(C_{pm}\)
- Economic Design of Variable Sampling IntervalX-Bar Control Charts for Monitoring Correlated Non Normal Samples
- Economic-statistical design of X ¥ charts for non-normal data by considering quality loss
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