On asymptotic distribution of parameter free tests for ergodic diffusion processes
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Publication:398574
Abstract: We consider two problems of constructing of goodness of fit tests for ergodic diffusion processes. The first one is concerned with a composite basic hypothesis for a parametric class of diffusion processes, which includes the Ornstein-Uhlenbeck and simple switching processes. In this case we propose asymptotically parameter free tests of Cram'er-von Mises type. The basic hypothesis in the second problem is simple and we propose asymptotically distribution free tests for a wider class of trend coefficients.
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Cited in
(15)- Goodness-of-fit test for switching diffusion
- Weak convergence of marked empirical processes in a Hilbert space and its applications
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