Identification of semiconductor contact resistivity
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Publication:3991962
DOI10.1090/qam/1134746zbMath0749.35062OpenAlexW2496227181MaRDI QIDQ3991962
Weifu Fang, Stavros N. Busenberg
Publication date: 28 June 1992
Published in: Quarterly of Applied Mathematics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1090/qam/1134746
Newton's methodNeumann boundary conditionselliptic equationsmoothness properties of the solution operator
Boundary value problems for second-order elliptic equations (35J25) PDEs in connection with optics and electromagnetic theory (35Q60) Inverse problems for PDEs (35R30) Motion of charged particles (78A35)
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