Optimal design of partially accelerated life tests for the exponential distribution under type-I censoring

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Publication:4015212


DOI10.1109/24.159807zbMath0749.62063MaRDI QIDQ4015212

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Publication date: 14 December 1992

Published in: IEEE Transactions on Reliability (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/24.159807


62K05: Optimal statistical designs

62N05: Reliability and life testing


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