The Effects of Races, Delays, and Delay Faults on Test Generation
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Publication:4055562
DOI10.1109/T-C.1974.223808zbMATH Open0301.94047OpenAlexW2048015929MaRDI QIDQ4055562FDOQ4055562
Authors: Melvin A. Breuer
Publication date: 1974
Published in: IEEE Transactions on Computers (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1109/t-c.1974.223808
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