A Method for the Correction of Garbled Words Based on the Levenshtein Metric

DOI10.1109/TC.1976.5009232MaRDI QIDQ4074401zbMATHOpenAlexFDO

Authors Teruo Okuda, Eiichi Tanaka, Tamotsu Kasai

Publication date 1976

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tc.1976.5009232

Mathematics Subject Classification ID

Pattern recognition, speech recognition (68T10)

Cited in

(10)

• Optimal matching of deformed patterns with positional influence
• How hard is to compute the edit distance
• How hard is computing the edit distance?
• The use of context in pattern recognition
• Edit distance for pushdown automata
• Constrained string editing
• Breadth-first search strategies for trie-based syntactic pattern recognition
• Some limit results for longest common subsequences
• A common basis for similarity measures involving two strings†
• Optimal and information theoretic syntactic pattern recognition involving traditional and transposition errors

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