A Nine-Valued Circuit Model for Test Generation

DOI10.1109/TC.1976.1674663MaRDI QIDQ4093344zbMATH OpenFDO

Authors Peter Muth

Publication date 1976

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Mathematics Subject Classification ID

Cited in

(2)

• Maxx: Test pattern optimisation with local search over an extended logic
• Forecasting the efficiency of test generation algorithms for combinational circuits

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