An Algorithm for the Generation of Test Sets for Combinational Logic Networks

DOI10.1109/T-C.1975.224295zbMATH Open0358.94044MaRDI QIDQ4132415FDOQ4132415

David T. Wang

Publication date: 1975

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Mathematics Subject Classification ID

Cited In (3)

• Electronic circuit diagnostic expert systems - a survey
• A complete critical path algorithm for test generation of combinational circuits
• An algorithm to generate complete test sets for stuck-at faults in combinational logic circuits

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