Properties of Faults and Criticalities of Values under Tests for Combinational Networks

DOI10.1109/T-C.1975.224296MaRDI QIDQ4132416zbMATH OpenFDO

Authors David T. Wang

Publication date 1975

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Mathematics Subject Classification ID

Cited in

(1)

• A complete critical path algorithm for test generation of combinational circuits

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