Properties of Faults and Criticalities of Values under Tests for Combinational Networks

DOI10.1109/T-C.1975.224296zbMATH Open0358.94045MaRDI QIDQ4132416FDOQ4132416

Authors: David T. Wang 

Publication date: 1975

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Mathematics Subject Classification ID

Cited In (1)

• A complete critical path algorithm for test generation of combinational circuits

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