Point processes and random measures

DOI10.2307/1426111zbMATH Open0376.60058OpenAlexW2317687633MaRDI QIDQ4153412FDOQ4153412

Authors: Jan Grandell 

Publication date: 1977

Published in: Advances in Applied Probability (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.2307/1426111

Mathematics Subject Classification ID

Stochastic processes (60G99)

Cited In (13)

• A Bayesian nonparametric goodness of fit test for right censored data based on approximate samples from the beta-Stacy process
• Process-level large deviations for nonlinear Hawkes point processes
• Band-limited mimicry of point processes by point processes supported on a lattice
• On a rapid simulation of the Dirichlet process
• On the central limit theorem for linear eigenvalue statistics on random surfaces of large genus
• Overly determined agents prevent consensus in a generalized Deffuant model on \(\mathbb{Z}\) with dispersed opinions
• On metrizing vague convergence of random measures with applications on Bayesian nonparametric models
• A glimpse of the conformal structure of random planar maps
• Weak convergence of stochastic point processes
• Poisson convergence in two dimensions with application to row and column exchangeable arrays
• Convergence of random measures in the space D[0,\(\infty)\)
• Probabilistic representations of fragmentation equations
• Perturbation analysis of a variable M/M/1 queue: a probabilistic approach

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