Optimal Replacement Rate of Devices with Lognormal Failure Distributions

DOI10.1109/TR.1977.5220107MaRDI QIDQ4155604zbMATH OpenFDO

Authors

Publication date 1977

Published in IEEE Transactions on Reliability (Search for Journal in Brave)

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25) Renewal theory (60K05)

Cited in

(1)

• Inferences on the Means of Two Log-Normal Distributions: A Computational Approach Test

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