Optimal Replacement Rate of Devices with Lognormal Failure Distributions

DOI10.1109/TR.1977.5220107zbMATH Open0375.60097MaRDI QIDQ4155604FDOQ4155604

Authors:

Publication date: 1977

Published in: IEEE Transactions on Reliability (Search for Journal in Brave)

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25) Renewal theory (60K05)

Cited In (1)

• Inferences on the Means of Two Log-Normal Distributions: A Computational Approach Test

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