Reliability Analysis of Multistate Device Networks
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Publication:4162351
DOI10.1109/TR.1978.5220338zbMath0381.62080MaRDI QIDQ4162351
K. K. Aggarwal, J. Sen Gupta, Krishna Gopal
Publication date: 1978
Published in: IEEE Transactions on Reliability (Search for Journal in Brave)
62N05: Reliability and life testing