A Likelihood Ratio Statistic for Testing Goodness of Fit with Randomly Censored Data

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Publication:4176324

DOI10.2307/2530599zbMath0393.62042OpenAlexW2106667515WikidataQ36652992 ScholiaQ36652992MaRDI QIDQ4176324

Bruce W. Turnbull, Lionel Weiss

Publication date: 1978

Published in: Biometrics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.2307/2530599




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