Patterns in Residuals in the Two-Way Layout

DOI10.2307/1267638MaRDI QIDQ4185679zbMATH OpenOpenAlexFDO

Authors Cuthbert Daniel

Publication date 1978

Full work available at URL https://doi.org/10.2307/1267638

zbMATH Keywords

Analysis of VarianceFactorial RepresentationInteractionsNonadditivityPattern RecognitionResidualsTwo-Way Layout

Mathematics Subject Classification ID

Classification and discrimination; cluster analysis (statistical aspects) (62H30) Analysis of variance and covariance (ANOVA) (62J10) Applications of statistics (62P99)

Cited in

(3)

• Interactions and outliers in the two-way analysis of variance
• Data features1
• Detection of Hidden Additivity and Inference Under Model Uncertainty for Unreplicated Factorial Studies via Bayesian Model Selection and Averaging

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